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GrainGenes Trait Study Report: Plant height, Narasimhamoorthy06

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Trait Study	Plant height, Narasimhamoorthy06
Trait	Height
Reference	Narasimhamoorthy B et al. (2006) Advanced backcross QTL analysis of a hard winter wheat x synthetic wheat population. Theoretical and Applied Genetics 112:787-796.
Description	Plant height (PHT) was was recorded at Hutchinson and Manhattan, Kansas.
Protocol	Plant height (PHT) was calculated as distance from the soil level to tips of a random fistful of spikes, averaged across three measurements per plot.
Map Data	Wheat, TA4152-4 x Karl92
Population Size	190
Population Type	BC2F2:4 lines
QTL Analysis Method	Single-marker regression. Positions of detected QTLs were determined approximately using simple interval mapping based on a BC2S1 model.
Markers Tested	151
Trait Score	PHT, Hutchinson 2003 PHT, Manhattan 2003
Data Source	Narasimhamoorthy, Brindha

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