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GrainGenes Trait Study Report: Flour yield, Nelson06

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Trait Study	Flour yield, Nelson06
Trait	Kernel texture
Description	Flour yield was measured at USDA Soft Wheat Regional Quality Laboratory in Wooster, OH (USA,) and INRA (Clermont-Ferrand, France).
Protocol	Flour yield was determined as the proportion by weight of straight-grade flour recovered from a milled grain sample, adjusted to correspond to a sample ground at 14% moisture. SE-adjusted yield has been corrected for softness equivalent.
Environment	Clermont-Ferrand 1994 Clermont-Ferrand 1997 Tulelake 1995 Tulelake 1999
Map Data	Wheat, Synthetic x Opata
Population Size	114
Population Type	F7 single-seed-descent lines
QTL Analysis Method	Composite interval mapping with QTL Cartographer 2.50, using forward regression selection of 5 cofactors and an acceptance threshold of LOD 3.8.
Markers Tested	554
Image	Composite interval map of wheat chromosome 5D for wheat quality traits in the ITMI population
Trait Score	Flour yield, Clermont-Ferrand 1994 Flour yield, Tulelake 1995 Flour yield, Tulelake 1999 SE-adjusted flour yield, Tulelake 1995
Data Source	Nelson, James C.

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