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GrainGenes Reference Report: TAG-116-797

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Reference	TAG-116-797
Title	Molecular mapping of genes for race-specific overall resistance to stripe rust in wheat cultivar Express.
Journal	Theoretical and Applied Genetics
Year	2008
Volume	116
Pages	797
Author	Lin F Chen XM
Abstract	Stripe rust (yellow rust), caused by Puccinia striiformis Westend. f. sp. tritici Eriks., is one of the most destructive diseases of wheat worldwide (Stubbs 1985; Wellings and McIntosh 1990; Chen 2005). Growing resistant cultivars is the most effective method to control the disease, but new races that develop rapidly in the fungal pathogen population can render race-specific resistances ineffective. More than 70 officially and provisionally designed genes for stripe rust resistance have been described (McIntosh et al. 1999, 2001; Chen 2005). However, the majority of these genes confer race-specific resistance and most of them are no longer individually effective. Because race-specific resistance genes usually do not provide long-term protection of crops from the disease, scientists have been seeking and using non-race-specific resistance since the late 1950s in the Pacific Northwest of the United States (Qayoum and Line 1985; Line 2002; Chen 2005). High-temperature, adult-plant (HTAP) resistance to stripe rust, which is non-race-specific, has been widely used to develop wheat cultivars with durable resistance in the US Pacific Northwest and other regions. Although HTAP or adult-plant resistance has been reported in numerous wheat cultivars, only a few genes or quantitative trait loci (QTL) for durable resistance have been mapped (Boukhatem et al. 2002; Bossolini et al. 2006; Lagudah et al. 2006; Rosewarne et al. 2006; Lin and Chen 2007).
External Databases	https://doi.org/10.1007/s00122-008-0894-0
Gene	YrExp2 (Triticum) YrExp1 (Triticum)
Locus	YrExp2 YrExp1
QTL	YrExp1 YrExp2

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