Query (optional)   in Class  All Allele Author Colleague Collection Assembly Gene Gene Class Gene Product Germplasm Image Journal Keyword Library Locus Map Map Data Marker Pathology Polymorphism Probe Protein QTL Rearrangement Reference Sequence Species Trait Trait Study Two Point Data  

---

GrainGenes Reference Report: CRI-30-177

[Submit comment/correction]

Reference	CRI-30-177
Title	Genetics of some metric traits in spring wheat under normal and late sown environments
Journal	Crop Improvement
Year	2003
Volume	30
Pages	177-184
Author	Ved P Joshi P
Abstract	The P1, P2, F1, F2, B1 and B2 generations of 2 crosses of spring wheat (HD 2329 x Raj 3970 and PBW 343 x Raj 3970), grown in Rajasthan, India, were used to study the genetics of number of days to heading, number of days to maturity, plant height, number of grains per spike and grain yield per spike under normal and late sowing conditions. Significant epistasis was observed for all characters under both environments. The relative magnitude of the dominance x dominance effect was greater than that of the additive x additive effect, but its direction was negative in most cases, indicating the difficulty in the improvement of these characters. Desirable significant heterosis was recorded for plant height, number of grains per spike, and grain yield per spike. The components of heterosis revealed that generally, the significant positive heterosis was caused by dominance effect. Significant inbreeding depression was also observed. The results suggest that biparental mating or diallel selective mating may be helpful for further improvement of the evaluated traits
Keyword	[ Hide all but 1 of 19 ] crop yield cross dominance environment epistasis gene interaction genetic effects heading heading date heterosis hybrid inbreeding inbreeding depression maturity plant breeding plant height seed spring yield components

GrainGenes is a product of the Agricultural Research Service of the US Department of Agriculture.