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GrainGenes Reference Report: EUP-135-255

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Reference	EUP-135-255
Title	Mapping quantitative trait loci for flag leaf senescence as a yield determinant in winter wheat under optimal and drought-stressed environments.
Journal	Euphytica
Year	2004
Volume	135
Pages	255-263
Author	Verma V [ Show all 6 ]
Keyword	[ Hide all but 1 of 33 ] aflp amplified fragment length polymorphism area bicolor l.moench control doubled haploid drought grain-sorghum growth haploid inheritance leaf senescence linkage maps locus map mapping mechanism nitrogen use efficiency polymorphism population qtl qtl analysis quantitative trait loci repeat senescence sequence sorghum improve yield ssr stay-green stress tolerance winter yield

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