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GrainGenes Reference Report: EUP-113-87

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Reference	EUP-113-87
Title	Genetic analysis of resistance to Fusarium head blight caused by Fusarium graminearum in Chinese wheat cultivar Sumai 3 and the Japanese cultivar Saikai 165.
Journal	Euphytica
Year	2000
Volume	113
Pages	87-99
Author	Ban T Suenaga K
Abstract	The genetic constitution of resistance to Fusarium head blight (FHB, scab) caused by Fusarium graminearum in the Chinese wheat cultivar Sumai 3 and the Japanese cultivar Saikai 165 was investigated using doubled haploid lines (DHLs) and recombinant inbred lines (RILs). Frequency distributions of DHLs derived from two F1 crosses, Sumai 3 (very resistant to resistant; VR-R) / Gamenya (very susceptible; VS) and Sumai 3 / Emblem (VS), fitted well to 1: 2: 1 (resistant: moderately resistant: susceptible) ratios for reaction to FHB in the field. It is suggested that the resistance of Sumai 3 is controlled by two major genes with additive effects. One of the resistance genes may be linked in repulsion to the dominant suppressor B1 for awnedness with recombination values 15.1 +/- 3.3% in Sumai 3 /Gamenya and 21.4 +/- 4.3% in Sumai 3 / Emblem. Saikai 165 is a Japanese resistant line derived from an F1 Sumai 3 / Asakaze-komugi (moderately resistant; MR). The data for RILs derived from the cross Emblem / Saikai 165, indicates that three resistance genes control the resistance of Saikai 165.
External Databases	https://doi.org/10.1023/A:1003951509797
Keyword	[ Hide all but 1 of 26 ] china chinese chinese wheat disease resistance doubled haploid fungal diseases fusarium fusarium graminearum fusarium headblight gene interaction genetic analysis genetic resistance gibberella zeae graminearum haploidy head blight inbred lines japan linkage recombinant inbred recombination resistance segregation triticum aestivum wheat cultivar wheat scab

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