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GrainGenes Reference Report: TAG-102-551

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Reference
TAG-102-551
Title
Identification of molecular markers for resistance to Septoria nodorum blotch in durum wheat
Journal
Theoretical and Applied Genetics
Year
2001
Volume
102
Pages
551-554
Author
Cao W
Hughes GR
Ma H
Dong Z
Abstract
Summary: The development of Septoria nodorum blotch-resistant cultivars has become a high priority objective for durum wheat breeding programs. Marker-assisted selection enables breeders to improve selection efficiency. In order to develop markers for resistance to Septoria nodorum blotch, a set of F5 recombinant inbred lines, derived from the crosses Sceptre/3-6, Sceptre/S9-10 and Sceptre/S12-1, was developed based on the F2-derived family method. Two RAPD markers, designated UBC521(650) and RC37(510), were detected by bulked segregant analysis and located approximately 15 and 13.1 centiMorgans (cM) from the resistance gene snbTM, respectively. A SCAR marker was also successfully developed for marker-assisted selection in breeding programs based on the sequence of the RAPD marker UBC521(650). This is the first report of DNA-based markers linked to resistance for Septoria nodorum blotch in durum wheat
External Databases
http://link.springer-ny.com/link/service/journals/00122/bibs/1102004/11020551.htm
Keyword
[ Hide all but 1 of 37 ]
aflp marker
arbitrary primers
blotch
breeding
breeding programs
bulked segregant analysis
cross
diallel analysis
downy mildew
durum
durum wheat
family
gene
glume blotch
inbred lines
inheritance
marker
marker-assisted selection
method
molecular marker
pcr
rapd
rapd markers
recombinant inbred line
resistance
resistance gene
scar
scar marker
segregant analysis
selection
septoria nodorum
septoria nodorum blotch
sequence
stagonospora nodorum
triticum aestivum
wheat breeding
winter wheat

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